Micron Technology DRAM , Part #: MT49H16M36SJ-25E:B | Dynamic random access memory | DEX sort-auto • JTAG logic compatible with

• JTAG logic compatible with IEEE 1149

Approximate Dimensions (WxDxH) 4 in x 5

Part #: SZNUP2105LT1G | DEX has been designed to protect the CAN transceiver in high−speed and fault tolerant networks from ESD and other harmful transient voltage events

A usable response of <100 μV and >3 V extends the dynamic range with no external scaling

Xiilnx FPGA Part #XC7VX1140T-2FLG1930C

Micron Technology DRAM , Part #: MT49H16M36SJ-25E:B | Dynamic random access memory | DEX sort-auto • JTAG logic compatible withMicron Technology DRAM , Part #: MT49H16M36SJ 25E: B features: 533 MHz DDR operation (1. 067 Gb s pin data rate) 38. 4 Gb s peak bandwidth (x36 at 533 MHz clock frequency) Organization 32 Meg x 9, 16 Meg x 18, and 8 Meg x 36 8 internal banks for concurrent operation and maximum bandwidth Reduced cycle time (15ns at 533 MHz) Nonmultiplexed addresses (address multiplexing option available) SRAM type interface Programmable READ latency (RL), row cycle